NASHVILLE – An upcoming AES Live Sound Training event, to run from Nov. 30-Dec. 2 at Soundcheck Studios in Nashville, will include dBTechnologies demos of the company’s ViO L1610 line array system and the ViO S218 subwoofer.
More details from dBTechnologies (www.dbtechnologies.com):
The ViO L1610, known for its astonishing 3-way power and sound pressure, and the ViO S218, celebrated for its powerful low frequency performance, will take center stage in the dBTech demonstration. dBTechnologies Applications engineers Marco Cantalu and Chris Wilson will both be on-site to guide visitors through the array of capabilities these products offer, offering a firsthand perspective on their application and benefits.
In addition to the ViO demos, Wilson will also give a technical presentation, providing valuable insights into both IIR (Infinite Impulse Response) and FIR (Finite Impulse Response) processing and the innovative ways that dBTechnologies utilizes the technology its flagship products.
Throughout the entire three-day event, dBTechnologies will also host exclusive classes on the ViO L1610 array processing, ecosystem and network controls. These will be held during three different time blocks each day, from 10 am to 5pm.
“We are excited to offer demos, presentations and masterclasses at this AES Live Event covering the ViO L1610 and S218,” says Chris Wilson. “This is a unique opportunity for professionals and enthusiasts to experience firsthand the cutting-edge technology and innovation that defines dBTechnologies.”
Key Event Details:
- Date: November 30th – December 2nd
- Booth Location: Room E
- Location: Soundcheck National, 750 Cowan St Nashville, TN
- Product Showcase: ViO L1610 and ViO S218 live product demonstrations
- Exclusive Masterclass: ViO L1610 Array Processing Masterclass
- Exclusive Masterclass: EcoSystem and Network Control Masterclass
For schedules of demos and masterclasses and complete information, register for free for the dBTechnologies events at the AES Live Sound Training here: www.aesbnashow.com
